Franz Josef Giessibl
Franz Josef Giessibl | |
|---|---|
 | |
| Born | 27 May 1962 |
| Alma mater | Eidgenössische Technische Hochschule Zürich, Technical University of Munich |
| Scientific career | |
| Fields | Experimental physics |
| Workplaces | University of Regensburg |
Academic advisors | Gerd Binnig, Gerhard Abstreiter |
Franz Josef Gießibl (born 27 May 1962 in Amerang) is a German physicist and university professor at the University of Regensburg.
Life
Giessibl studied physics from 1982 to 1987 at the Technical University of Munich and at Eidgenössische Technischen Hochschule Zürich. He received a diploma in experimental physics in 1988 with Professor Gerhard Abstreiter and continued with a PhD in physics with Nobel Laureate Gerd Binnig at the IBM Physics Group Munich on atomic force microscopy. After submitting his PhD thesis in the end of 1991, he continued for 6 months as a Postdoctoral Fellow at the IBM Physics Group Munich and moved to Silicon Valley to join Park Scientific Instruments, Inc as a senior scientist and later director of vacuum products from mid 1992 until the end of 1994. He joined the Munich office of management consulting firm McKinsey & Company from 1995 to 1996 as a senior associate. During that time, he invented the qPlus sensor,[1] a new probe for atomic force microscopy and continued experimental and theoretical work on the force microscope at the chair of Professor Jochen Mannhart at University of Augsburg where he received a habilitation in 2001.
In 2005, he obtained offers for a chair at the University of Bristol (England) and University of Regensburg (Germany).[2] In 2006, he joined the faculty at the Department of Physics at the University of Regensburg in Germany.[3] From about 2005, he collaborated with the scanning tunneling microscopy groups of IBM Almaden Research Center (Science 2008) and IBM Zurich Research Laboratory studying single-electron charges on single gold atoms (Science 2009). and from about 2010 with National Institute of Standards and Technology (Nature Comm. 2021). to help to establish combined scanning tunneling microscopy and atomic force microscopy at ultralow temperatures. He was a visiting fellow at the center for nanoscience and technology (CNST) of the National Institute of Standards and Technology and a visiting professor at University of Maryland, College Park from fall 2015 to spring 2016 and at National University of Singapore with several research visits 2023 to 2025 (Nature 2025)..
Some of Giessibl's experimental and simulated images inspired the offset print editions Erster Blick (2000) and Graphit (2004) by visual artist Gerhard Richter.[4][5]
Franz Giessibl is married and has two sons.[6]
Scientific contributions
Giessibl established atomic force microscopy as a surface science tool with atomic resolution,[7] launching the field of Non-contact atomic force microscopy. ScholarGPS lists him among the six most highly ranked scholars in atomic force microscopy (lifetime) and among the 14 most highly ranked scholars in microscopy (lifetime).[8] Together with his team, he even obtained subatomic spatial resolution (Giessibl, Franz J.; Hembacher, S.; Bielefeldt, H.; Mannhart, J. (21 July 2000). "Subatomic Features on the Silicon (111)-(7×7) Surface Observed by Atomic Force Microscopy". Science. 289 (5478): 422–425. doi:10.1126/science.289.5478.422. ISSN 0036-8075. Retrieved 27 August 2026.),[9][10][11][12][13] and published papers on ground breaking experiments,[14][15] instrumentation[16] and theoretical foundations[17][18] of atomic force microscopy. Giessibl is the inventor of the qPlus sensor,[19][20] a sensor for Non-contact atomic force microscopy that relies on a quartz cantilever. His invention has enabled atomic force microscopy to obtain subatomic spatial resolution on individual atoms and submolecular resolution on organic molecules. Today, the qPlus sensor is used in more than 500 commercial and homebuilt atomic force microscopes around the world.
- 1992: Built the first low-temperature force microscope for ultrahigh vacuum with Gerd Binnig (PhD adviser) and Christoph Gerber
- Giessibl, F. J.; Gerber, Ch.; Binnig, G. (1 March 1991). "A low-temperature atomic force/scanning tunneling microscope for ultrahigh vacuum". Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena. 9 (2): 984–988. Bibcode:1991JVSTB...9..984G. doi:10.1116/1.585441. ISSN 1071-1023. Retrieved 27 August 2026.
- and obtained atomic resolution on KBr with it
- Giessibl, F.J.; Binnig, G. (1992). "Investigation of the (001) cleavage plane of potassium bromide with an atomic force microscope at 4.2 K in ultra-high vacuum". Ultramicroscopy. 42–44: 281–289. doi:10.1016/0304-3991(92)90280-W. Retrieved 27 August 2026.. KBr has a very low reactivity, yet major challenges such as jump-to-contact of AFM tip and sample had to be overcome to obtain atomic resolution.
- 1992: Proposed a mechanism allowing atomic resolution in noncontact-AFM
- Giessibl, F. J. (15 June 1992). "Theory for an electrostatic imaging mechanism allowing atomic resolution of ionic crystals by atomic force microscopy". Physical Review B. 45 (23): 13815–13818. Bibcode:1992PhRvB..4513815G. doi:10.1103/PhysRevB.45.13815. ISSN 0163-1829. PMID 10001493. Retrieved 27 August 2026.
- 1994: Solved the problem of imaging reactive samples and obtained for the first time atomic resolution on Silicon 7x7 by force microscopy using frequency-modulation atomic force microscopy in noncontact mode with large amplitudes
- Giessibl, Franz J. (6 January 1995). "Atomic Resolution of the Silicon (111)-(7×7) Surface by Atomic Force Microscopy". Science. 267 (5194): 68–71. Bibcode:1995Sci...267...68G. doi:10.1126/science.267.5194.68. ISSN 0036-8075. PMID 17840059. Retrieved 27 August 2026.
- 1996: Invented the qPlus sensor, a self sensing AFM quartz sensor that is self sensing (piezoelectric effect), highly stable in frequency and stiff enough to allow sub-Angstrom oscillation amplitudes
- (Patents DE19633546, US6240771, Giessibl, Franz J. (28 December 1998). "High-speed force sensor for force microscopy and profilometry utilizing a quartz tuning fork". Applied Physics Letters. 73 (26): 3956–3958. Bibcode:1998ApPhL..73.3956G. doi:10.1063/1.122948. ISSN 0003-6951. Retrieved 27 August 2026.).
- 1997: Introduces a formula that connects frequency shifts and forces for large amplitudes
- Giessibl, Franz J. (15 December 1997). "Forces and frequency shifts in atomic-resolution dynamic-force microscopy". Physical Review B. 56 (24): 16010–16015. Bibcode:1997PhRvB..5616010G. doi:10.1103/PhysRevB.56.16010. ISSN 0163-1829. Retrieved 27 August 2026.
- 2000: Obtains atomic spatial resolution using qPlus sensor
- Giessibl, Franz J. (13 March 2000). "Atomic resolution on Si(111)-(7×7) by noncontact atomic force microscopy with a force sensor based on a quartz tuning fork". Applied Physics Letters. 76 (11): 1470–1472. doi:10.1063/1.126067. ISSN 0003-6951. Retrieved 27 August 2026.
- 2000: Observes subatomic resolution on tip features
- Giessibl, Franz J.; Hembacher, S.; Bielefeldt, H.; Mannhart, J. (21 July 2000). "Subatomic Features on the Silicon (111)-(7×7) Surface Observed by Atomic Force Microscopy". Science. 289 (5478): 422–425. Bibcode:2000Sci...289..422G. doi:10.1126/science.289.5478.422. ISSN 0036-8075. PMID 10903196. Retrieved 27 August 2026.
- 2001: Invents an algorithm to deconvolute forces from frequency shifts
- Giessibl, F. J. (1 January 2001). "A direct method to calculate tip–sample forces from frequency shifts in frequency-modulation atomic force microscopy". Applied Physics Letters. 78 (1): 123–125. Bibcode:2001ApPhL..78..123G. doi:10.1063/1.1335546. ISSN 0003-6951. Retrieved 27 August 2026.
- 2003: Extended version of his habilitation thesis is published in Reviews of Modern Physics
- Giessibl, Franz J. (29 July 2003). "Advances in atomic force microscopy". Reviews of Modern Physics. 75 (3): 949–983. Bibcode:2003RvMP...75..949G. doi:10.1103/RevModPhys.75.949. ISSN 0034-6861. Retrieved 27 August 2026.
- 2003: Obtaines atomically resolved lateral force microscopy
- Giessibl, Franz J.; Herz, Markus; Mannhart, Jochen (17 September 2002). "Friction traced to the single atom". Proceedings of the National Academy of Sciences. 99 (19): 12006–12010. Bibcode:2002PNAS...9912006G. doi:10.1073/pnas.182160599. ISSN 0027-8424. PMC 129388. PMID 12198180.
- 2004: Achieves sub-Angstrom resolution on tip features using a qPlus sensor in a low temperature AFM using higher harmonic force microscopy
- Hembacher, Stefan; Giessibl, Franz J.; Mannhart, Jochen (16 July 2004). "Force Microscopy with Light-Atom Probes". Science. 305 (5682): 380–383. Bibcode:2004Sci...305..380H. doi:10.1126/science.1099730. ISSN 0036-8075. PMID 15192156. Retrieved 27 August 2026.
- 2005–2008: Helps to spread out qPlus sensor technology to IBM Research Laboratories Almaden and Rüschlikon, leading to measurements of forces that act during atomic manipulation
- Ternes, Markus; Lutz, Christopher P.; Hirjibehedin, Cyrus F.; Giessibl, Franz J.; Heinrich, Andreas J. (22 February 2008). "The Force Needed to Move an Atom on a Surface". Science. 319 (5866): 1066–1069. Bibcode:2008Sci...319.1066T. doi:10.1126/science.1150288. ISSN 0036-8075. PMID 18292336. Retrieved 27 August 2026.
- and single-electron charges on single gold atoms
- Gross, Leo; Mohn, Fabian; Liljeroth, Peter; Repp, Jascha; Giessibl, Franz J.; Meyer, Gerhard (12 June 2009). "Measuring the Charge State of an Adatom with Noncontact Atomic Force Microscopy". Science. 324 (5933): 1428–1431. Bibcode:2009Sci...324.1428G. doi:10.1126/science.1172273. ISSN 0036-8075. PMID 19520956. Retrieved 27 August 2026.
- 2012: Introduces carbon monoxide front atom identification (COFI), a method for the atomic and subatomic characterization of scanning probe tips
- Welker, Joachim; Giessibl, Franz J. (27 April 2012). "Revealing the Angular Symmetry of Chemical Bonds by Atomic Force Microscopy". Science. 336 (6080): 444–449. Bibcode:2012Sci...336..444W. doi:10.1126/science.1219850. ISSN 0036-8075. PMID 22539715. Retrieved 27 August 2026.
- 2013: Observes evidence for superexchange interaction and very low noise data of exchange interactions between CoSm tips and antiferromagnetic NiO
- Pielmeier, Florian; Giessibl, Franz J. (24 June 2013). "Spin Resolution and Evidence for Superexchange on NiO(001) Observed by Force Microscopy". Physical Review Letters. 110 (26) 266101. arXiv:1304.6515. Bibcode:2013PhRvL.110z6101P. doi:10.1103/PhysRevLett.110.266101. ISSN 0031-9007. PMID 23848902. Retrieved 27 August 2026.
- 2013: Observes atomic resolution in ambient conditions without special sample preparation
- Wastl, Daniel S.; Weymouth, Alfred J.; Giessibl, Franz J. (12 June 2013). "Optimizing atomic resolution of force microscopy in ambient conditions". Physical Review B. 87 (24) 245415. arXiv:1303.5204. Bibcode:2013PhRvB..87x5415W. doi:10.1103/PhysRevB.87.245415. ISSN 1098-0121. Retrieved 27 August 2026.
- 2014: Measurement of CO-CO interactions by lateral force microscopy
- Weymouth, Alfred John; Hofmann, Thomas; Giessibl, Franz J. (7 March 2014). "Quantifying Molecular Stiffness and Interaction with Lateral Force Microscopy". Science. 343 (6175): 1120–1122. Bibcode:2014Sci...343.1120W. doi:10.1126/science.1249502. ISSN 0036-8075. PMID 24505131. Retrieved 27 August 2026.
- 2015: Atomic resolution of few atom metal clusters and subatomic resolution of single metal atoms
- Emmrich, Matthias; Huber, Ferdinand; Pielmeier, Florian; Welker, Joachim; Hofmann, Thomas; Schneiderbauer, Maximilian; Meuer, Daniel; Polesya, Svitlana; Mankovsky, Sergiy; Ködderitzsch, Diemo; Ebert, Hubert; Giessibl, Franz J. (17 April 2015). "Subatomic resolution force microscopy reveals internal structure and adsorption sites of small iron clusters". Science. 348 (6232): 308–311. Bibcode:2015Sci...348..308E. doi:10.1126/science.aaa5329. ISSN 0036-8075. PMID 25791086. Retrieved 27 August 2026.
- 2016: Simultaneous inelastic tunneling spectroscopy and AFM
- Okabayashi, Norio; Gustafsson, Alexander; Peronio, Angelo; Paulsson, Magnus; Arai, Toyoko; Giessibl, Franz J. (13 April 2016). "Influence of atomic tip structure on the intensity of inelastic tunneling spectroscopy data analyzed by combined scanning tunneling spectroscopy, force microscopy, and density functional theory". Physical Review B. 93 (16) 165415. arXiv:1504.04790. Bibcode:2016PhRvB..93p5415O. doi:10.1103/PhysRevB.93.165415. ISSN 2469-9950. Retrieved 27 August 2026.
- AFM with superconductive tips
- Peronio, Angelo; Giessibl, Franz J. (1 September 2016). "Attempts to test an alternative electrodynamic theory of superconductors by low-temperature scanning tunneling and atomic force microscopy". Physical Review B. 94 (9) 094503. arXiv:1607.05060. Bibcode:2016PhRvB..94i4503P. doi:10.1103/PhysRevB.94.094503. ISSN 2469-9950. Retrieved 27 August 2026.
- Multifrequency AFM using bimodal qPlus sensors
- Ooe, Hiroaki; Kirpal, Dominik; Wastl, Daniel S.; Weymouth, Alfred J.; Arai, Toyoko; Giessibl, Franz J. (3 October 2016). "Amplitude dependence of image quality in atomically-resolved bimodal atomic force microscopy". Applied Physics Letters. 109 (14) 141603. arXiv:1605.06584. Bibcode:2016ApPhL.109n1603O. doi:10.1063/1.4964125. ISSN 0003-6951. Retrieved 27 August 2026.
- 2018: Simultaneous inelastic tunneling spectroscopy and AFM shows bond weakening effect
- Okabayashi, Norio; Peronio, Angelo; Paulsson, Magnus; Arai, Toyoko; Giessibl, Franz J. (2018). "Vibrations of a molecule in an external force field". Proceedings of the National Academy of Sciences. 115 (18): 4571–4576. Bibcode:2018PNAS..115.4571O. doi:10.1073/pnas.1721498115. ISSN 0027-8424. PMC 5939093. PMID 29666274.
- 2018: Joint study with John Sader group on well- and ill posed force deconvolution schemes
- Sader, John E.; Hughes, Barry D.; Huber, Ferdinand; Giessibl, Franz J. (2018). "Interatomic force laws that evade dynamic measurement". Nature Nanotechnology. 13 (12): 1088–1091. arXiv:1709.07571. Bibcode:2018NatNa..13.1088S. doi:10.1038/s41565-018-0277-x. ISSN 1748-3387. PMID 30523295. Retrieved 27 August 2026.
- 2019: Review article about qPlus sensors and applications
- Giessibl, Franz J. (1 January 2019). "The qPlus sensor, a powerful core for the atomic force microscope". Review of Scientific Instruments. 90 (1) 011101. Bibcode:2019RScI...90a1101G. doi:10.1063/1.5052264. ISSN 0034-6748. PMID 30709191. Retrieved 27 August 2026.
- 2021: Measurement of very weak bonds to artificial atoms formed by quantum corrals
- Stilp, Fabian; Bereczuk, Andreas; Berwanger, Julian; Mundigl, Nadine; Richter, Klaus; Giessibl, Franz J. (11 June 2021). "Very weak bonds to artificial atoms formed by quantum corrals". Science. 372 (6547). American Association for the Advancement of Science (AAAS): 1196–1200. Bibcode:2021Sci...372.1196S. doi:10.1126/science.abe2600. ISSN 0036-8075. PMID 34010141. S2CID 234791972.
Selected publications
- Giessibl, F.J.; Binnig, G. (1992). "Investigation of the (001) cleavage plane of potassium bromide with an atomic force microscope at 4.2 K in ultra-high vacuum" (PDF). Ultramicroscopy. 42 (5682): 281. doi:10.1016/0304-3991(92)90280-w.
- Giessibl, F.J. (1995). "Atomic Resolution of the Silicon (111)-(7x7) Surface by Atomic Force Microscopy" (PDF). Science. 267 (5194): 68–71. Bibcode:1995Sci...267...68G. doi:10.1126/science.267.5194.68. PMID 17840059. S2CID 20978364.
- Giessibl, F.J. (1997). "Forces and frequency shifts in atomic-resolution dynamic-force microscopy". Phys. Rev. B. 56 (24): 16010–16015. Bibcode:1997PhRvB..5616010G. doi:10.1103/PhysRevB.56.16010.
- Giessibl, F.J. (2003). "Advances in atomic force microscopy". Rev. Mod. Phys. 75 (3): 949–983. arXiv:cond-mat/0305119. Bibcode:2003RvMP...75..949G. doi:10.1103/RevModPhys.75.949. S2CID 18924292.
- Hembacher, S. (16 July 2004). "Force Microscopy with Light-Atom Probes" (PDF). Science. 305 (5682): 380–383. Bibcode:2004Sci...305..380H. doi:10.1126/science.1099730. PMID 15192156. S2CID 6591847.
- Ternes, M.; Lutz, C. P.; Hirjibehedin, C. F.; Giessibl, F. J.; Heinrich, A. J. (22 February 2008). "The Force Needed to Move an Atom on a Surface" (PDF). Science. 319 (5866): 1066–1069. Bibcode:2008Sci...319.1066T. doi:10.1126/science.1150288. PMID 18292336. S2CID 451375.
- Gross, L.; Mohn, F.; Liljeroth, P.; Repp, J.; Giessibl, F. J.; Meyer, G. (11 June 2009). "Measuring the Charge State of an Adatom with Noncontact Atomic Force Microscopy". Science. 324 (5933): 1428–1431. Bibcode:2009Sci...324.1428G. doi:10.1126/science.1172273. PMID 19520956. S2CID 1767952.
- Weymouth, A. J.; Wutscher, T.; Welker, J.; Hofmann, T.; Giessibl, F. J. (June 2011). "Phantom Force Induced by Tunneling Current: A Characterization on Si(111)". Physical Review Letters. 106 (22) 226801. arXiv:1103.2226. Bibcode:2011PhRvL.106v6801W. doi:10.1103/PhysRevLett.106.226801. PMID 21702622. S2CID 16174307.
- Welker, J.; Giessibl, F. J. (26 April 2012). "Revealing the Angular Symmetry of Chemical Bonds by Atomic Force Microscopy". Science. 336 (6080): 444–449. Bibcode:2012Sci...336..444W. doi:10.1126/science.1219850. PMID 22539715. S2CID 206540429.
- Giessibl, F. J. (20 June 2013). "Seeing the Reaction" (PDF). Science. 340 (6139): 1417–1418. Bibcode:2013Sci...340.1417G. doi:10.1126/science.1239961. PMID 23788791. S2CID 36441856.
- Weymouth, A. J.; Hofmann, T.; Giessibl, F. J. (6 February 2014). "Quantifying Molecular Stiffness and Interaction with Lateral Force Microscopy" (PDF). Science. 343 (6175): 1120–1122. Bibcode:2014Sci...343.1120W. doi:10.1126/science.1249502. PMID 24505131. S2CID 43915098.
- Emmrich, M.; et al. (19 March 2015). "Subatomic resolution force microscopy reveals internal structure and adsorption sites of small iron clusters" (PDF). Science. 348 (6232): 303–307. Bibcode:2015Sci...348..308E. doi:10.1126/science.aaa5329. hdl:10339/95969. PMID 25791086. S2CID 29910509.
- Giessibl, F.J.; et al. (30 January 2019). "The qPlus sensor, a powerful core for the atomic force microscope" (PDF). Review of Scientific Instruments. 90 (1) 011101: 011101–1–59. Bibcode:2019RScI...90a1101G. doi:10.1063/1.5052264. hdl:10339/95969. PMID 30709191. S2CID 29910509.
- Huber, F.; et al. (12 September 2019). "Chemical bond formation showing a transition from physisorption to chemisorption". Science. 365 (6462): 235–238. Bibcode:2019Sci...366..235H. doi:10.1126/science.aay3444. PMID 31515246. S2CID 202569091.
- Stilp, F.; et al. (11 June 2021). "Very weak bonds to artificial atoms formed by quantum corrals". Science. 372 (6547): 1196–1200. Bibcode:2021Sci...372.1196S. doi:10.1126/science.abe2600. PMID 34010141. S2CID 202569091.
Books
- "Noncontact Atomic Force Microscopy". NanoScience and Technology. Berlin, Heidelberg: Springer Berlin Heidelberg. 2009. doi:10.1007/978-3-642-01495-6. ISBN 978-3-642-01494-9. ISSN 1434-4904.
- "Noncontact Atomic Force Microscopy". NanoScience and Technology. Cham: Springer International Publishing. 2015. doi:10.1007/978-3-319-15588-3. hdl:11693/50865. ISBN 978-3-319-15587-6. ISSN 1434-4904. S2CID 92873134.
- Gießibl, Franz J. (4 February 2022). Erster Blick in das Innere eines Atoms - Begegnungen mit Gerhard Richter zwischen Kunst und Wissenschaft (in German). Verlag der Buchhandlung Walther und Franz König. ISBN 978-3-7533-0174-7.
- Gießibl, Franz J. (8 February 2022). First View Inside an Atom: Encounters with Gerhard Richter Between Art and Science. Walther Konig Verlag. ISBN 978-3-7533-0188-4.
- Giessibl, Franz J. (16 September 2026). Atomic Force Microscopy and Atomic Manipulation. An Inquiry into Matter. Springer. ISBN 978-3-032-32201-2.
Awards
- 1994: R&D 100 Award (together with Brian Trafas)[21]
- 2000: Deutscher Nanowissenschaftspreis[22]
- 2001: Rudolf-Kaiser-Preis[23]
- 2009: Karl Heinz Beckurts-Preis[24]
- 2014: Joseph F. Keithley Award For Advances in Measurement Science of the American Physical Society[25]
- 2015: Rudolf-Jaeckel Prize of the German Vacuum Society[26]
- 2016: Foresight Institute Feynman Prize in Nanotechnology[27]
- 2023: Innovation in Materials Characterization Award of the Materials Research Society (USA) [28]
- 2024: Heinrich Rohrer Medal – Grand Medal by Surface Science Society of Japan and IBM Research [29]
- 2024: National Institute for Materials Science Award - NIMS Award [30]
Honors
- 2023: Fellow of the American Physical Society (USA)[31]
- 2024: International Fellow of Japan Society of Vacuum and Surface Science (JVSS)[32]
- 2025: Member of European Academy of Sciences and Art (EASA) [33]
- 2025: Fellow of European Academy of Sciences (EurASc) [34]
- 2026: Distinguished Fellow of International Engineering and Technology Institute (IETI) [35]
Special Lectures
- 2010: Ehrenfest Kolloquium Leiden (27 October 2010) (Netherlands)[36]
- 2013: Zernike Kolloquium Groningen (Netherlands)[37]
- 2023: Erster Blick in das Innere eines Atoms. Begegungen mit Gerhard Richter zwischen Kunst und Wissenschaft, Waldhaus Sils, Schweiz (19. März 2023)[38]
- 2024: Scanning probe microscopy with qPlus sensors, Distinguished Colloquium Peking University, China (19 July 2024) [39]
- 2025: Seeing Dents in the Atom, Plenary talk at the Spring Meeting of the German Physical Society, Section Condensed Matter, University of Regensburg, (17 March 2025) [40]
References
- ↑ "Website qPlus sensor".
- ↑ "CV Prof. Dr. Franz J. Gießibl – Universität Regensburg". www.uni-regensburg.de.
- ↑ "Lehrstuhl Prof. Dr. Franz J. Gießibl – Universität Regensburg". www.uni-regensburg.de.
- ↑ Nielsen, K. H. (2008). "Nanotech, Blur and Tragedy in Recent Artworks by Gerhard Richter". Leonardo. 41 (5): 484–492. doi:10.1162/leon.2008.41.5.484. S2CID 57561154.
- ↑ Giessibl, Franz J.; Richter, Gerhard (2022). Erster Blick in das Innere eines Atoms – Begegnungen mit Gerhard Richter zwischen Kunst und Wissenschaft (in German). Köln: Verlag der Buchhandlung Walther und Franz König. ISBN 978-3-7533-0174-7. OCLC 1336840173. Retrieved 27 August 2026.
- ↑ Uni Regensburg Giessibl CV
- ↑ Giessibl, F. J. (1995). "Atomic resolution of the Silicon (111)-(7x7) surface by atomic force microscopy" (PDF). Science. 267 (5194): 68–71. Bibcode:1995Sci...267...68G. doi:10.1126/science.267.5194.68. PMID 17840059. S2CID 20978364.
- ↑ "Scholar Profiles and Rankings". ScholarGPS. Retrieved 26 April 2026.
- ↑ "Nanophysik: Atome unterm Mikroskop". Spiegel Online. 27 July 2000.
- ↑ pop (23 January 2003). "Nanophysiker Franz Gießibl hantiert mit Apfelsinen". Die Welt – via www.welt.de.
- ↑ Chang, Kenneth (22 February 2008). "Scientists Measure What It Takes to Push a Single Atom". The New York Times.
- ↑ "Scanning Probe Microscopy: From Sublime to Ubiquitous". Physical Review Letters. 2 May 2016.
- ↑ "Nature Nanotechnology's Anniversary issues of March and April 2016 mark the anniversary of a number of key discoveries in the history of nanotechnology" (PDF).
- ↑ Giessibl, F. J. (1995). "Atomic resolution of the Silicon (111)-(7x7) surface by atomic force microscopy" (PDF). Science. 267 (5194): 68–71. Bibcode:1995Sci...267...68G. doi:10.1126/science.267.5194.68. PMID 17840059. S2CID 20978364.
- ↑ Giessibl, F. J.; Hembacher, S.; Bielefeldt, H.; Mannhart, J. (2000). "Subatomic features on the Silicon (111)-(7x7) surface observed by atomic force microscopy" (PDF). Science. 289 (5478): 422–425. Bibcode:2000Sci...289..422G. doi:10.1126/science.289.5478.422. PMID 10903196.
- ↑ Giessibl, F. J.; Pielmeier, F.; Eguchi, T.; An, T.; Hasegawa, Y. (2011). "Comparison of force sensors for atomic force microscopy based on quartz tuning forks and length-extensional resonators.". Phys. Rev. B. 84 (12) 125409. arXiv:1104.2987. Bibcode:2011PhRvB..84l5409G. doi:10.1103/physrevb.84.125409. S2CID 22025299.
- ↑ Giessibl, F. J. (1997). "Forces and frequency shifts in atomic-resolution dynamic-force microscopy". Phys. Rev. B. 56 (24): 16010–16015. Bibcode:1997PhRvB..5616010G. doi:10.1103/physrevb.56.16010.
- ↑ Giessibl, F. J. (2003). "Advances in atomic force microscopy". Reviews of Modern Physics. 75 (3): 949–983. arXiv:cond-mat/0305119. Bibcode:2003RvMP...75..949G. doi:10.1103/revmodphys.75.949. S2CID 18924292.
- ↑ F. J. Giessibl: Device for noncontact intermittent contact scanning of a surface and a process therefore. US Patent 6240771
- ↑ F. J. Giessibl: Sensor for noncontact profiling of a surface. US Patent 8393009
- ↑ R&D 100 award for creation of AutoProbe VP microscope with Park Scientific Instruments. Retrieved 28 December 2025
- ↑ "nanoanalytik-hamburg.de". www.nanoanalytik-hamburg.de.
- ↑ "Augsburger Rasterkraftmikroskopie-Experte Gießibl erhält den Rudolf-Kaiser-Preis 2001". idw-online.de.
- ↑ "Die Stiftung – Karl Heinz Beckurts-Stiftung". www.beckurts-stiftung.de.
- ↑ "2014 Keithley Award Recipient". www.aps.org.
- ↑ Kopnarski, Michael (2015). "Rudolf Jaeckel-Preis 2015 an Prof. Dr. Franz J. Gießibl". Vakuum in Forschung und Praxis. 27 (5): 38. doi:10.1002/vipr.201590050. S2CID 98336631.
- ↑ Admin. "Foresight Prizes". Foresight Institute.
- ↑ "Innovation-in-Materials-Characterization Award".
- ↑ "Heinrich Rohrer Medal". Retrieved 30 March 2024.
- ↑ "NIMS award". Retrieved 15 June 2024.
- ↑ "APS Fellow Archive". Retrieved 27 October 2023.
- ↑ "JVSS Fellows". jvss.jp. Retrieved 31 October 2024.
- ↑ "EASA members". euro-acad.eu. Retrieved 19 May 2025.
- ↑ "EurASc members". euro-acad.eu. Retrieved 31 July 2025.
- ↑ "IETI Fellows". Retrieved 13 January 2026.
- ↑ "Colloquium Ehrenfestii Oct 27 2010: Franz J. Giessibl, Advances in atomic force microscopy".
- ↑ "Zernike Colloquium Franz J. Giessibl (Atomic force microscopy using the qPlus sensor: resolving charge distributions within atoms, exchange interactions and atomic resolution in ambient conditions) – Loos Group – MCNPM – Zernike (ZIAM) – Research – University of Groningen". www.rug.nl. 14 September 2013.
- ↑ "Erster Blick in das Innere eines Atoms. Begegungen mit Gerhard Richter zwischen Kunst und Wissenschaft". Youtube. 21 April 2025.
- ↑ "Scanning probe microscopy with qPlus sensors". www.koushare.com/live/details/35818. 19 July 2024.
- ↑ "Seeing Dents in the Atom". www.dpg-verhandlungen.de/year/2025/conference/regensburg/part/plv/session/1/contribution/1. 17 March 2025.